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Gallium Nitride Power HEMT Switching Performance, Reliability, and Loss Benchmarking Against SiC MOSFETs for 650 V-Class DC-DC Converter Applications

Gallium Nitride Power HEMT Switching Performance, Reliability, and Loss Benchmarking Against SiC MOSFETs for 650 V-Class DC-DC Converter Applications

Publisher : PJPCR
Author(s)
Erik T. Holmberg; Adaeze C. Okonkwo; Satoshi M. Yamada
Abstract

This study investigates switching performance, thermal reliability, and converter efficiency benchmarking of 650 V GaN e-HEMT devices versus SiC MOSFETs in a 500 kHz hard-switched DC-DC converter topology within the context of power electronics and wide bandgap semiconductor engineering, an area of growing scientific importance given its implications for high-frequency DC-DC conversion for data center power delivery, EV on-board charging, and photovoltaic microinverters. Using double-pulse switching energy measurement, converter efficiency measurement via precision power analyzer, and 1,000-hour accelerated reliability testing at 125 C junction temperature, we examine GaN HEMT lateral 2DEG channel and zero reverse recovery enabling 3-5x lower switching energy than SiC at 650 V class, enabling efficiency advantage to emerge above 200 kHz switching frequency where switching loss dominates in 12 device variants (4 GaN + 4 SiC + 4 Si reference) tested at 8 switching frequencies (50-1,000 kHz) with 1,000-hour AHT on 48 devices (4 devices x 12 variants) drawn from power electronics test bench at 400 V bus, 500 W, 50% duty cycle with Pearson coil current and high-voltage differential voltage probes. Results indicate that GaN e-HEMT achieves 98.8% peak converter efficiency at 500 kHz versus 97.8% for SiC MOSFET (1.0 pp advantage) with 3.2x lower switching energy (Eon+Eoff = 4.8 vs. 15.4 uJ) enabling 2.4x higher power density at equivalent thermal management (p < 0.001), with 98.8% GaN vs. 97.8% SiC peak efficiency; 3.2x lower switching energy; 2.4x power density advantage as the primary quantitative benchmark. Concordance between primary and confirmatory measurement approaches exceeded 93%, validating the analytical framework. These findings contribute empirically to power electronics and wide bandgap semiconductor engineering and carry actionable implications for the design of programs and policies targeting high-frequency DC-DC conversion for data center power delivery, EV on-board charging, and photovoltaic microinverters.

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Princeton, New Jersey, United States
Published and Managed by The Princeton Journal of Precollegiate Scholarship Inc.
ISSN: 3143-8423
DOI: 10.67698

Copyright © Princeton Journal of Pre-Collegiate Research. All rights reserved

PJPCR is independently operated and is not affiliated with Princeton University or any of its colleges, departments or programs.

Princeton, New Jersey, United States
Published and Managed by The Princeton Journal of Precollegiate Scholarship Inc.
ISSN: 3143-8423
DOI: 10.67698

Copyright © Princeton Journal of Pre-Collegiate Research. All rights reserved

PJPCR is independently operated and is not affiliated with Princeton University or any of its colleges, departments or programs.

Princeton, New Jersey, United States
Published and Managed by The Princeton Journal of Precollegiate Scholarship Inc.
ISSN: 3143-8423
DOI: 10.67698

Copyright © Princeton Journal of Pre-Collegiate Research. All rights reserved

PJPCR is independently operated and is not affiliated with Princeton University or any of its colleges, departments or programs.